Special Issues or Columns


IEEE Transactions on Reliability (SCI indexed, Impact factor: 2.729)

PHM 2021 is collaborating with IEEE Transactions on Reliability. IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.


IEEE Access Reliability Society Section

In keeping with IEEE's continued commitment to providing options to support the needs of all authors, IEEE is introducing a new Reliability Society Section in IEEE Access, IEEE's award-winning, multidisciplinary open access journal.

Be among the first to have your article peer-reviewed and published in this new Section. This is an exciting opportunity for your research to benefit from the high visibility and interest the journal's marketing launch will generate. Your work will also be exposed to 5 million unique monthly users of the IEEE Xplore® Digital Library.

The Reliability Society Section in IEEE Access draws on the expert technical community to continue IEEE's commitment to publishing the most highly-cited content. The topical editor is Professor Steven Li, of Western New England University. Our goal is to publish quickly—the Journal peer-review process targets a publication period of 6 weeks for most accepted papers.

This journal is fully open and compliant with funder mandates, including Plan S. To submit a paper, please go to the following website.

https://mc.manuscriptcentral.com/ieee-access